DuPont issues 2019 »Global Photovoltaic Reliability Study«

Since 2018, overall PV module defect rates increased and reached 34 percent of 6.5 million panels surveyed; total backsheet defects amounted to 14 percent, an increase of 47 percent from 2018. Cracking comprises 66 percent of all backsheet defects. The data emerged from the recent issued DuPont Photovoltaic and Advanced Materials’ annual »Global Field Reliability Study«, with results from their field inspection and analysis program that tracks material degradation and its effects on global solar module performance. »This program is one of the most thorough of its kind, guided by a multistep inspection protocol at sites in North America, Europe, Asia, and the Middle East and staffed with experienced scientists in the solar industry,« says the company. The number of site inspections in the report grew from 275 to 355. The number of panels surveyed increased from 4.2 million to over 6.5 million (1.04 GW to 1.8 GW).
This 2019 report was assembled from inspection and analysis by DuPont teams using a variety of criteria including: component, material, mounting, time in service and climate. »While our field analysis looks at all component materials, we focus special attention on backsheet durability, which plays a critical role in ensuring modules will last long enough to reach the financial objectives of their owners,« said Kaushik Roy Choudhury, Global Reliability Manager for DuPont.
The report lays out failures with PET, polyamide and PVDF backsheets and issues with glass on glass modules the team is witnessing. »This is the second year we’ve reported on Glass-Glass module failures, as our data continues to grow with modules that have been in the field over four years,« noted Roy Choudhury. The report also highlights trends in module failures and defects, chronicles backsheet defects by panel age, and provides comprehensive data on backsheet defects by temperature and climate. The report (12 pages) can be downloaded free of charge at »www.photovoltaics.dupont.com«.
© PHOTON

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